Simon Glass 61ccd886e2 dm: usb: Clean up USB after each test ... The USB subsystem has a few counters that need to be reset since they are stored in static variables rather than driver-model data. An example is usb_max_devs. Ultimately we should move this data into the USB uclass. For now, make sure that USB is reset after each test, so that the counters go back to zero. Note: this is not a perfect solution: It a USB test fails it will exit immediately and leave USB un-reset. The impact here is that it may cause subsequence test failures in the same run. Signed-off-by: Simon Glass <sjg@chromium.org>		2016-03-14 15:34:50 -06:00
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dm	dm: usb: Clean up USB after each test	2016-03-14 15:34:50 -06:00
env	test: env: Add a test of the new regex behavior for attrs	2015-05-21 09:16:18 -04:00
fs	test/fs: error case fixes/enhancements	2016-01-13 21:05:21 -05:00
image	image: Fix FIT and vboot tests to exit sandbox correctly	2016-02-26 08:53:10 -07:00
py	test/py: skip tests that require large CONFIG_SYS_MAXARGS	2016-02-26 08:42:12 -05:00
stdint	test: Add a simple test to detected warnings with uint64_t, uintptr_t	2014-10-27 11:04:01 -04:00
trace	trace: Improve the trace test number recognition	2016-02-26 08:53:10 -07:00
vboot	image: Fix FIT and vboot tests to exit sandbox correctly	2016-02-26 08:53:10 -07:00
cmd_ut.c	test: env: Add test framework for env	2015-05-21 09:16:18 -04:00
command_ut.c	test/py: test the shell if command	2016-01-20 19:06:23 -07:00
common.sh	test: Add a test for command repeat	2014-09-24 18:30:28 -04:00
compression.c	Add support for LZ4 decompression algorithm	2015-10-11 17:12:10 -04:00
Kconfig	test: env: Add test framework for env	2015-05-21 09:16:18 -04:00
Makefile	test: dm: Move the time test over to the ut command	2015-05-21 09:16:17 -04:00
time_ut.c	test: dm: Move the time test over to the ut command	2015-05-21 09:16:17 -04:00
ut.c	test: Record and silence console in tests	2015-11-19 20:27:51 -07:00