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126 lines
3.5 KiB
C
126 lines
3.5 KiB
C
/*
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* Copyright (C) 2009-2016 Realtek Semiconductor Corp.
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* All Rights Reserved.
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*
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* This program is the proprietary software of Realtek Semiconductor
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* Corporation and/or its licensors, and only be used, duplicated,
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* modified or distributed under the authorized license from Realtek.
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*
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* ANY USE OF THE SOFTWARE OTHER THAN AS AUTHORIZED UNDER
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* THIS LICENSE OR COPYRIGHT LAW IS PROHIBITED.
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*
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* $Revision: 71708 $
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* $Date: 2016-09-19 11:31:17 +0800 (Mon, 19 Sep 2016) $
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*
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* Purpose : Definition of SDK test APIs in the SDK
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*
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* Feature : SDK test APIs
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*
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*/
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#ifndef __SDK_TEST_H__
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#define __SDK_TEST_H__
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/*
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* Include Files
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*/
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#include <common/rt_type.h>
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/*
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* Symbol Definition
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*/
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#define SDKTEST_GRP_NONE 0x80000000
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#define SDKTEST_GRP_ALL 0x00000001
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#define SDKTEST_GRP_HAL 0x00000002
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#define SDKTEST_GRP_DOT1X 0x00000004
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#define SDKTEST_GRP_EEE 0x00000008
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#define SDKTEST_GRP_FLOWCTRL 0x00000010
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#define SDKTEST_GRP_L2 0x00000020
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#define SDKTEST_GRP_L3 0x00000040
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#define SDKTEST_GRP_OAM 0x00000080
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#define SDKTEST_GRP_PIE 0x00000100
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#define SDKTEST_GRP_PORT 0x00000200
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#define SDKTEST_GRP_QOS 0x00000400
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#define SDKTEST_GRP_RATE 0x00000800
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#define SDKTEST_GRP_SEC 0x00001000
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#define SDKTEST_GRP_STP 0x00002000
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#define SDKTEST_GRP_SWITCH 0x00004000
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#define SDKTEST_GRP_TRAP 0x00008000
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#define SDKTEST_GRP_TRUNK 0x00010000
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#define SDKTEST_GRP_VLAN 0x00020000
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#define SDKTEST_GRP_SVLAN 0x00040000
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#define SDKTEST_GRP_FILTER 0x00080000
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#define SDKTEST_GRP_NIC 0x00100000
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#define SDKTEST_GRP_OSAL 0x00200000
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#define SDKTEST_GRP_STATS 0x00400000
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#define SDKTEST_GRP_MIRROR 0x00800000
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#define SDKTEST_GRP_MPLS 0x01000000
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#define SDKTEST_GRP_TIME 0x02000000
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#define SDKTEST_GRP_LED 0x04000000
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#define SDKTEST_GRP_ACL 0x08000000
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typedef struct unit_test_case_s
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{
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int32 no;
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char *name;
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int32(*fp) (uint32, uint32);
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uint32 group;
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} unit_test_case_t;
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#define UNIT_TEST_CASE( case_no, func, group_mask ) \
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{ \
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no: case_no, \
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name: #func, \
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fp: func, \
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group: group_mask, \
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}
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/*
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* Data Declaration
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*/
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/*
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* Function Declaration
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*/
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/* Function Name:
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* sdktest_run
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* Description:
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* Test one test case or group test cases in the SDK for one specified device.
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* Input:
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* unit - unit id
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* *pStr - string context
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* Output:
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* None
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* Return:
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* RT_ERR_OK
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* RT_ERR_FAILED
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* RT_ERR_UNIT_ID - invalid unit id
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* Note:
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* None
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*/
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extern int32
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sdktest_run(uint32 unit, uint8 *pStr);
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/* Function Name:
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* sdktest_run_id
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* Description:
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* Test some test cases from start to end case index in the SDK for one specified device.
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* Input:
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* unit - unit id
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* start - start test case number
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* end - end test case number
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* Output:
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* None
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* Return:
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* RT_ERR_OK
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* RT_ERR_FAILED
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* RT_ERR_UNIT_ID - invalid unit id
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* Note:
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* None
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*/
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extern int32
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sdktest_run_id(uint32 unit, uint32 start, uint32 end);
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#endif /* __SDK_TEST_H__ */
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