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130 lines
2.4 KiB
C
130 lines
2.4 KiB
C
/*
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* Copyright (C) 2009-2015 Realtek Semiconductor Corp.
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* All Rights Reserved.
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*
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* This program is the proprietary software of Realtek Semiconductor
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* Corporation and/or its licensors, and only be used, duplicated,
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* modified or distributed under the authorized license from Realtek.
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*
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* ANY USE OF THE SOFTWARE OTHER THAN AS AUTHORIZED UNDER
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* THIS LICENSE OR COPYRIGHT LAW IS PROHIBITED.
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*
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* $Revision:
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* $Date:
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*
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* Purpose : Define the test method utility macro and function in the SDK.
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*
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* Feature : SDK common utility
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*
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*/
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#ifndef __RT_UTIL_TEST_H__
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#define __RT_UTIL_TEST_H__
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/*
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* Include Files
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*/
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#include <common/rt_type.h>
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#include <common/util.h>
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#include <common/util/rt_util_serdes.h>
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#include <rtk/l2.h>
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/*
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* Symbol Definition
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*/
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/*
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* Data Type Declaration
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*/
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typedef enum rt_test_result_e
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{
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RT_TEST_PASS = 0,
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RT_TEST_FAIL = -1,
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}rt_test_result_t;
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#define RT_TEST_OPT_VERBASE 0x1
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#define RT_TEST_OPT_BIDIR 0x2 //bidirectinal test
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/* RT_TEST_NIC_TX */
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typedef struct rt_test_nicTxTestData_s
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{
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/* param */
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uint32 unit;
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rtk_port_t txPort;
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rtk_port_t rxPort;
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uint32 pktCnt;
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uint32 pktLen;
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uint32 testOption;
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/* backup config */
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rtk_l2_newMacLrnMode_t testPortLrnMode, peerPortLrnMode;
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rtk_action_t testPortAct, peerPortAct;
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/* result */
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rt_test_result_t result;
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}rt_test_nicTxTestData_t;
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/* RT_TEST_SERDES_MODE */
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typedef struct rt_test_sdsTestData_s
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{
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/* param */
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uint32 unit;
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rt_sds_t txSds;
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rt_sds_t rxSds;
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rtk_sds_testMode_t mode;
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uint32 msec;
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uint32 testOption;
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uint32 cntRecord;
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/* result */
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rt_test_result_t result;
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}rt_test_sdsTestData_t;
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typedef enum rt_test_testId_e
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{
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RT_TEST_NIC_TX = 0,
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RT_TEST_SERDES_MODE,
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RT_TEST_END
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}rt_test_testId_t;
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typedef struct rt_test_proc_s
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{
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char *testName;
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int32 (*test_init)(void *);
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int32 (*do_test)(void *);
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int32 (*test_done_cb)(void *);
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int32 (*test_iter)(void *, const int32 const *, int32 *);
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int32 (*test_cleanup)(void *);
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}rt_test_proc_t;
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/*
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* Data Declaration
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*/
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/*
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* Macro Definition
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*/
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/*
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* Function Declaration
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*/
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/* Function Name:
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* rt_test_run
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* Description:
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* Run RTK test
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* Input:
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* test_id - test id
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* data - includes test param and the output of the test
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* Output:
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* None
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* Return:
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* None
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* Note:
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*/
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extern int32 rt_test_run(int32 test_id, void *data);
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#endif /* __RT_UTIL_LED_H__ */
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